Steven E. Diebold: search on Z-Library

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1

Spectroscopic ellipsometry characterization of high-k gate stacks with Vt shift layers

Ming Di, Eric Bersch, Robert Clark, Steven Consiglio, Gert Leusink, Alain C. Diebold

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 396 KB

english, 2011

2

Structure and composition of the Aleutian island arc and implications for continental crustal growth

Steven Holbrook, W., Lizarralde, D., McGeary, S., Bangs, N., Diebold, J.

Journal:

Year:

1999

Language:

english

File:

PDF, 497 KB

english, 1999

3

Factors Influencing Applicants' Match Rank Order

Steven E. Diebold, Cecile. T. D. Mavid, Carl M. Ferraro. MD

Journal:

Academic Emergency Medicine

Year:

1995

Language:

english

File:

PDF, 368 KB

english, 1995

4

Moonlighting and Student Debt

Steven E. Diebold,

Journal:

Academic Emergency Medicine

Year:

1995

Language:

english

File:

PDF, 251 KB

english, 1995

5

Comparison of methods to determine bandgaps of ultrathin HfO2 films using spectroscopic ellipsometry

Di, Ming, Bersch, Eric, Diebold, Alain C., Consiglio, Steven, Clark, Robert D., Leusink, Gert J., Kaack, Torsten

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2011

Language:

english

File:

PDF, 654 KB

english, 2011

6

Real Exchange Rates under the Gold Standard

Francis X. Diebold, Steven Husted and Mark Rush

Journal:

Journal of Political Economy

Year:

1991

Language:

english

File:

PDF, 1.69 MB

english, 1991

7

Post-Deregulation Bank-Deposit-Rate Pricing: The Multivariate Dynamics

Francis X. Diebold and Steven A. Sharpe

Journal:

Journal of Business and Economic Statistics

Year:

1990

Language:

english

File:

PDF, 408 KB

english, 1990

8

The Income- and Expenditure-Side Estimates of U.S. Output Growth [with Comments and Discussion]

JEREMY J. NALEWAIK, FRANCIS X. DIEBOLD and J. STEVEN LANDEFELD

Journal:

Brookings Papers on Economic Activity

Year:

2010

Language:

english

File:

PDF, 4.30 MB

english, 2010

9

Post-Deregulation Bank-Deposit-Rate Pricing: The Multivariate Dynamics

Diebold, Francis X., Sharpe, Steven A.

Journal:

Journal of Business and Economic Statistics

Year:

1990

Language:

english

File:

PDF, 629 KB

english, 1990

10

Engineering crystallinity of atomic layer deposited gate stacks containing ultrathin HfO2 and a Ti-based metal gate: Effects of postmetal gate anneal and integration schemes

Consiglio, Steven, Tapily, Kandabara, Clark, Robert D., Hasegawa, Toshio, Amano, Fumitaka, Leusink, Gert J., Jordan-Sweet, Jean, Vasić, Relja, Medikonda, Manasa, Diebold, Alain C.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2014

Language:

english

File:

PDF, 3.91 MB

english, 2014

11

ECS Transactions [ECS 220th ECS Meeting - Boston, MA (October 9 - October 14, 2011)] - Structural Characteristics of Electrically Scaled ALD HfO

Consiglio, Steven, Clark, Robert D., Bersch, Eric, LaRose, Joshua, Wells, Ilyssa, Tapily, Kandabara, Leusink, Gert J., Diebold, Alain

Year:

2011

Language:

english

File:

PDF, 1.35 MB

english, 2011

12

EDGE deep seismic reflection transect of the eastern Aleutian arc-trench layered lower crust reveals underplating and continental growth

Moore, J. Casey, Diebold, John, Fisher, M. A., Sample, J., Brocher, T., Talwani, M., Ewing, John, Huene, R. von, Rowe, C., Stone, D., Stevens, Chris, Sawyer, Dale

Journal:

Year:

1991

Language:

english

File:

PDF, 373 KB

english, 1991

13

[AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009 - Albany (New York) (11–15 May 2009)] AIP Conference Proceedings - Photoreflectance Spectroscopic Characterization of Si with SiO[sub 2] and HfO[sub 2] Dielectric Layers

Zhang, Tianhao, Di, Ming, Bersch, Eric J., Chouaib, Houssam, Salnik, Alex, Nicolaides, Lena, Bevis, Chris, Consiglio, Steven, Clark, Robert D., Diebold, Alain C., Secula, Erik M., Seiler, David G., Kh

Year:

2009

Language:

english

File:

PDF, 620 KB

english, 2009

14

[AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009 - Albany (New York) (11–15 May 2009)] AIP Conference Proceedings - A Novel Wafer-plane Dosimeter for EUV Lithography

Grantham, Steven, Tarrio, Charles, Secula, Erik M., Seiler, David G., Khosla, Rajinder P., Herr, Dan, Michael Garner, C., McDonald, Robert, Diebold, Alain C.

Year:

2009

Language:

english

File:

PDF, 822 KB

english, 2009

15

[AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009 - Albany (New York) (11–15 May 2009)] AIP Conference Proceedings - Spectroscopic Ellipsometry Characterization of High-k films on SiO[sub 2]∕Si

Di, Ming, Bersch, Eric, Consiglio, Steven, Zhang, Tianhao, Tyagi, Parul, Clark, Robert D., Leusink, Gert J., Srivatsa, Arun, Diebold, Alain C., Secula, Erik M., Seiler, David G., Khosla, Rajinder P.,

Year:

2009

Language:

english

File:

PDF, 481 KB

english, 2009

16

Higher-k Tetragonal Phase Stabilization in Atomic Layer Deposited Hf1-xZrxO2 (0

Dey, Sonal, Tapily, Kandabara, Consiglio, Steven, Yu, Kai-Hung, Clark, Robert D., Wajda, Cory S., Leusink, Gert J., Woll, Arthur R., Diebold, Alain C.

Journal:

Year:

2016

Language:

english

File:

PDF, 253 KB

english, 2016

17

Role of Ge and Si substrates in higher-k tetragonal phase formation and interfacial properties in cyclical atomic layer deposition-anneal Hf 1−x Zr x O 2 /Al 2 O 3 thin film stacks

Dey, Sonal, Tapily, Kandabara, Consiglio, Steven, Clark, Robert D., Wajda, Cory S., Leusink, Gert J., Woll, Arthur R., Diebold, Alain C.

Journal:

Journal of Applied Physics

Year:

2016

Language:

english

File:

PDF, 4.88 MB

english, 2016

18

Real Exchange Rates under the Gold Standard

Diebold, Francis X., Husted, Steven, Rush, Mark

Journal:

Journal of Political Economy

Year:

1991

Language:

english

File:

PDF, 1.65 MB

english, 1991

19

Atomic layer deposited ultrathin metal nitride barrier layers for ruthenium interconnect applications

Dey, Sonal, Yu, Kai-Hung, Consiglio, Steven, Tapily, Kandabara, Hakamata, Takahiro, Wajda, Cory S., Leusink, Gert J., Jordan-Sweet, Jean, Lavoie, Christian, Muir, David, Moreno, Beatriz, Diebold, Alai

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2017

Language:

english

File:

PDF, 2.59 MB

english, 2017

20

Structural Correlation of Ferroelectric Behavior in Mixed Hafnia-Zirconia High-k Dielectrics for FeRAM and NCFET Applications

Mukundan, Vineetha, Beckmann, Karsten, Tapily, Kandabara, Consiglio, Steven, Clark, Robert, Leusink, Gert, Cady, Nathaniel, Diebold, Alain C

Journal:

Year:

2019

File:

PDF, 1.28 MB

2019

21

Structural Correlation of Ferroelectric Behavior in Mixed Hafnia-Zirconia High-k Dielectrics for FeRAM and NCFET Applications

Mukundan, Vineetha, Beckmann, Karsten, Tapily, Kandabara, Consiglio, Steven, Clark, Robert, Leusink, Gert, Cady, Nathaniel, Diebold, Alain C

Journal:

Year:

2019

Language:

english

File:

PDF, 1.28 MB

english, 2019

22

Local Structure and Coordination Define Adsorption in a Model Ir₁/Fe₃O₄ Single-Atom Catalyst

Jakub, Zdenek, Hulva, Jan, Meier, Matthias, Bliem, Roland, Kraushofer, Florian, Setvin, Martin, Schmid, Michael, Diebold, Ulrike, Franchini, Cesare, Parkinson, Gareth Steven

Journal:

Angewandte Chemie International Edition

Year:

2019

Language:

english

File:

PDF, 1.45 MB

english, 2019